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Calculations of Electron Inelastic Mean Free Paths IV. Evaluation of calculated IMFPs and of the predictive IMFP formula TPP-2 for electron energies between 50 and 2000 eV

Description/Abstract:

We have made additional evaluations of the electron inelastic mean free paths ([MFPs) and of the predictive IMFP formula TPP-2 presented ...

Keyword:

Evaluations of TPP-2 formula, IMFP, and predictive IMFP formula TPP-2

Resource Type:

Article

Author:

Tanuma, S., Powell, C. J., and Penn, D. R.

Journal:

Surface and Interface Analysis

Date Uploaded:

07/11/2023

Date Modified:

07/11/2023
Summary of ISO/TC 201 Standard: XX ISO 18118: 2004 — Surface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy —Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials

Description/Abstract:

ISO 18118 provides guidance on the measurement and use of experimentally determined relative sensitivity factors for the quantitative ana...

Keyword:

AES, Auger electron spectroscopy, ISO, International Organization for Standardization, X-ray photoelectron spectroscopy, XPS, quantitative surface analysis, and relative sensitivity factor

Resource Type:

Article

Author:

TANUMA, Shigeo

Journal:

Surface and Interface Analysis

Date Uploaded:

08/10/2020

Date Modified:

01/07/2021