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Filtering by: Creator TANUMA, Shigeo Publisher Wiley

Calculations of electron inelastic mean free paths.VIII. Data for 15 elemental solids over the 50-2000 eV range

Description/Abstract:

We report calculations of electron inelastic mean free paths (IMFPs) for 50 eV to 2000 eV electrons in 14 elemental solids (Li, Be, diamo...

Keyword:

IMFP, Li, Be, diamond, graphite, Na, K, Sc, Ge, In, Sn, Cs, Gd, Tb, Dy, Al, TPP-2M equation, electron inelastic mean free path, and rare-earth elements

Resource Type:

Article

Author:

TANUMA, Shigeo, C.J. Powell, and D.R. Penn

Journal:

SURFACE AND INTERFACE ANALYSIS

Date Uploaded:

29/05/2023

Date Modified:

30/05/2023
Summary of ISO/TC 201 Standard: XX ISO 18118: 2004 — Surface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy —Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials

Description/Abstract:

ISO 18118 provides guidance on the measurement and use of experimentally determined relative sensitivity factors for the quantitative ana...

Keyword:

AES, Auger electron spectroscopy, ISO, International Organization for Standardization, X-ray photoelectron spectroscopy, XPS, quantitative surface analysis, and relative sensitivity factor

Resource Type:

Article

Author:

TANUMA, Shigeo

Journal:

Surface and Interface Analysis

Date Uploaded:

08/10/2020

Date Modified:

01/07/2021