Index Catalog // MDR

Description/Abstract:: The prediction of electron inelastic mean free paths (IMFPs) from simple material parameters is a challenging problem in studies using el...
Keyword:: inelastic mean free path and machine learning
Resource Type:: Article
Author:: Xun Liu, Lihao Yang, Zhufeng Hou, Bo Da, Kenji Nagata, Hideki Yoshikawa, Shigeo Tanuma, Yang Sun, and Zejun Ding
Date Uploaded:: 11/04/2023

Description/Abstract:: Plasmon gain by core-level electrons or elastic electrons observed in past studies seems to be of no practical value in material characte...
Keyword:: Plasmon Energy Gain and Secondary Electron
Resource Type:: Article
Author:: Bo Da, Jiangwei Liu, Yoshitomo Harada, Nguyen T. Cuong, Kazuhito Tsukagoshi, Jin Hu, Lihao Yang, Zejun Ding, Hideki Yoshikawa, and Shigeo Tanuma
Date Uploaded:: 11/04/2023
Date Modified:: 11/04/2023

Description/Abstract:: Measuring the electron-transport properties of substrate-supported nanomaterials with the traditional two-point comparison method is diff...
Keyword:: four-point probe technique, inelastic mean free path, and monolayer graphene
Resource Type:: Article
Author:: Bo Da, Yang Sun, Zhufeng Hou, Jiangwei Liu, Nguyen Thanh Cuong, Kazuhito Tsukagoshi, Hideki Yoshikawa, Shigeo Tanuma, Jin Hu, Zhaoshun Gao, and Zejun Ding
Date Uploaded:: 04/04/2023
Date Modified:: 05/04/2023

Description/Abstract:: In this article, we developed a new method to analyze the complex chemical reactions induced by electron beam radiolysis based on big dat...
Keyword:: Complex Electron Radiolysis
Resource Type:: Article
Author:: Zhihao Zhang, Hongxuan Guo, Bo Liu, Dali Xian, Xuanxuan Liu, Bo Da, and Litao Sun
Date Uploaded:: 28/02/2023

Description/Abstract:: We present an up-to-date Monte Carlo simulation of electron backscattering coefficient of beryllium, which is an important material in fu...
Keyword:: electron backscattering coefficient
Resource Type:: Article
Author:: Abrar Hussain, Lihao Yang, Shifeng Mao, Bo Da, Károly Tőkési, and Z.J. Ding
Date Uploaded:: 28/02/2023

Description/Abstract:: Ohmic contact with high thermal stability is essential to promote hydrogen-terminated diamond (H-diamond) based electronic devices for hi...
Keyword:: Ni, high-temperature, hydrogen-terminated diamond (H-diamond), ohmic contact, and specific contact resistance
Resource Type:: Article
Author:: Xiaolu Yuan, Jiangwei Liu, Jinlong Liu, Junjun Wei, Bo Da, Chengming Li, and Yasuo Koide
Date Uploaded:: 28/02/2023

Description/Abstract:: Here, thermal stabilities for Ohmic contact properties of Pt, Au, and Pd on the same hydrogen-terminated diamond (H-diamond) epitaxial la...
Keyword:: thermal stabilities for Ohmic contact properties
Resource Type:: Article
Author:: Xiaolu Yuan, Jiangwei Liu, Siwu Shao, Jinlong Liu, Junjun Wei, Bo Da, Chengming Li, and Yasuo Koide
Date Uploaded:: 28/02/2023

Description/Abstract:: Characterization techniques available for bulk or thin-film solid-state materials have been extended to substrate-supported nanomaterials...
Keyword:: Virtual substrate method
Resource Type:: Article
Author:: Bo Da, Jiangwei Liu, Mahito Yamamoto, Yoshihiro Ueda, Kazuyuki Watanabe, Nguyen Thanh Cuong, Songlin Li, Kazuhito Tsukagoshi, Hideki Yoshikawa, Hideo Iwai, Shigeo Tanuma, Hongxuan Guo, Zhaoshun Gao, Xia Sun, and Zejun Ding
Date Uploaded:: 28/02/2023

Description/Abstract:: We present the first theoretical recipe for the clear and individual separation of surface, bulk and Begrenzungs effect components in sur...
Keyword:: reflection electron energy loss spectroscopy spectrum
Resource Type:: Article
Author:: Lihao Yang, Bo Da, Károly Tőkési, and Z. J. Ding
Date Uploaded:: 28/02/2023

Description/Abstract:: We calculated electron inelastic mean free paths (IMFPs) for liquid water from its optical energy-loss function (ELF) for electron energi...
Keyword:: EAL, Electron Inelastic Mean Free Path, IMFP, effective attenuation length, liquid water, relativistic TPP-2M, relativistic full Penn algorithm, and static structure factor
Resource Type:: Article
Author:: Shinotsuka, Hiroshi, Da, Bo, Tanuma, Shigeo, Yoshikawa, Hideki, Powell , Cedric J, and Penn, David R
Journal:: Surface and Interface Analysis
Date Uploaded:: 31/07/2020
Date Modified:: 02/07/2021

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