Index Catalog // MDR

Description/Abstract:: There is a need to develop an automatic spectral analysis method integrated with reference database as the reference database builds up. ...
Keyword:: X-ray photoelectron spectroscopy, Automatic spectrum analysis, Bayesian information criterion, and Multiple core level spectra
Resource Type:: Article
Author:: Murakami, Ryo, Tanaka, Hiromi, Shinotsuka Hiroshi, Nagata, Kenji, and Yoshikawa, Hideki
Journal:: Journal of Electron Spectroscopy and Related Phenomena
Date Uploaded:: 15/06/2022
Date Modified:: 17/06/2022

Description/Abstract:: We developed and implemented a fully automated method to perform X-ray photoelectron spectroscopy (XPS) spectral analysis based on the ac...
Keyword:: X-ray photoelectron spectroscopy (XPS), Active Shirley method, Akaike information criterion (AIC), and Bayesian information criterion (BIC)
Resource Type:: Article
Author:: Shinotsuka, Hiroshi, Yoshikawa, Hideki, Murakami, Ryo, Nakamura, Kazuki, Tanaka, Hiromi, and Yoshihara, Kazuhiro
Journal:: Journal of Electron Spectroscopy and Related Phenomena
Date Uploaded:: 10/06/2022
Date Modified:: 17/06/2022

Description/Abstract:: We calculated electron inelastic mean free paths (IMFPs) for liquid water from its optical energy-loss function (ELF) for electron energi...
Keyword:: EAL, Electron Inelastic Mean Free Path, IMFP, effective attenuation length, liquid water, relativistic TPP-2M, relativistic full Penn algorithm, and static structure factor
Resource Type:: Article
Author:: Shinotsuka, Hiroshi, Da, Bo, Tanuma, Shigeo, Yoshikawa, Hideki, Powell , Cedric J, and Penn, David R
Journal:: Surface and Interface Analysis
Date Uploaded:: 31/07/2020
Date Modified:: 02/07/2021

Description/Abstract:: We have calculated mean escape depths (MEDs, D) of photoelectrons from Si, Cu, and Au excited by linearly polarized X-rays over the 50 to...
Keyword:: MED, asymmetry parameter, high-energy photoelectron spectroscopy, lnearly polarized X-rays, and mean escape depth
Resource Type:: Article
Author:: Tanuma, Shigeo, Yoshikawa, Hideki, Shinotsuka, Hiroshi, and Ueda, Ryuichi
Journal:: Journal of Electron Spectroscopy and Related Phenomena
Date Uploaded:: 26/06/2020
Date Modified:: 02/07/2021

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