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Yoshikawa, Hideki
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Development of multiple core-level XPS spectra decomposition method based on the Bayes...
Automated information compression of XPS spectrum using information criteria
English Translation of J. Surf. Anal. 24, 192-205(2018), Auger Depth Profiling Analysi...
Auger Depth Profiling Analysis of FeNi/CoFeB/FeNi Specimen Using an Ultra Low Angle In...
Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence ...
Calculations of Electron Inelastic Mean Free Paths. XI. Data for Liquid Water for Ener...
Calculations of Mean Escape Depths of Photoelectrons in Elemental Solids Excited by Li...
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Publication
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7
Keyword
Ultra Low Angle Incidence Ion Beam
3
Auger Depth Profiling Analysis
2
HfO2/Si
2
Active Shirley method
1
Akaike information criterion (AIC)
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English
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Japanese
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Elsevier
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Surface Analysis Society of Japan
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Wiley
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Article
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Rights Statement Sim
Creative Commons BY-NC-ND Attribution-NonCommercial-NoDerivs 4.0 International
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In Copyright
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Material/Specimen
HfO2
2
FeNi/CoFeB/FeNi Thin Film
1
Date accepted
2019
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2020
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Date submitted
2019
1
Author
Yoshikawa, Hideki
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Ogiwara, Toshiya
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Shinotsuka, Hiroshi
3
Murakami, Ryo
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Nagata, Takahiro
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https://creativecommons.org/licenses/by-nc-nd/4.0/
2
Journal
Journal of Surface Analysis
3
Journal of Electron Spectroscopy and Related Phenomena
2
Journal of Electron Spectroscopy and Related Phenomena
1
Surface and Interface Analysis
1