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Ueda, Ryuichi
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Calculations of Mean Escape Depths of Photoelectrons in Elemental Solids Excited by Linearly Polarized X-rays for High-Energy Photoelectron Spectroscopy
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MED
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asymmetry parameter
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high-energy photoelectron spectroscopy
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lnearly polarized X-rays
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mean escape depth
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English
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Elsevier
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Article
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Creative Commons BY-NC-ND Attribution-NonCommercial-NoDerivs 4.0 International
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Author
Shinotsuka, Hiroshi
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Tanuma, Shigeo
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Ueda, Ryuichi
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Yoshikawa, Hideki
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https://creativecommons.org/licenses/by-nc-nd/4.0/
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Journal
Journal of Electron Spectroscopy and Related Phenomena
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