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Tanuma, Shigeo
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mean escape depth
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Calculations of Mean Escape Depths of Photoelectrons in Elemental Solids Excited by Linearly Polarized X-rays for High-Energy Photoelectron Spectroscopy
Description/Abstract:
We have calculated mean escape depths (MEDs, D) of photoelectrons from Si, Cu, and Au excited by linearly polarized X-rays over the 50 to...
Keyword:
MED
,
asymmetry parameter
,
high-energy photoelectron spectroscopy
,
lnearly polarized X-rays
, and
mean escape depth
Resource Type:
Article
Author:
Tanuma, Shigeo
,
Yoshikawa, Hideki
,
Shinotsuka, Hiroshi
, and
Ueda, Ryuichi
Journal:
Journal of Electron Spectroscopy and Related Phenomena
Date Uploaded:
26/06/2020
Date Modified:
02/07/2021
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1
Keyword
MED
1
asymmetry parameter
1
high-energy photoelectron spectroscopy
1
lnearly polarized X-rays
1
mean escape depth
[remove]
1
Language
English
1
Publisher
Elsevier
1
Resource type
Article
1
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open
1
Rights Statement Sim
Creative Commons BY-NC-ND Attribution-NonCommercial-NoDerivs 4.0 International
1
Author
Shinotsuka, Hiroshi
1
Tanuma, Shigeo
[remove]
1
Ueda, Ryuichi
1
Yoshikawa, Hideki
1
License
https://creativecommons.org/licenses/by-nc-nd/4.0/
1
Journal
Journal of Electron Spectroscopy and Related Phenomena
1