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Filtering by: Author Tanuma, Shigeo Journal Journal of Electron Spectroscopy and Related Phenomena Type of work Publication Resource type Article

Calculations of Mean Escape Depths of Photoelectrons in Elemental Solids Excited by Linearly Polarized X-rays for High-Energy Photoelectron Spectroscopy

Description/Abstract:

We have calculated mean escape depths (MEDs, D) of photoelectrons from Si, Cu, and Au excited by linearly polarized X-rays over the 50 to...

Keyword:

MED, asymmetry parameter, high-energy photoelectron spectroscopy, lnearly polarized X-rays, and mean escape depth

Resource Type:

Article

Author:

Tanuma, Shigeo, Yoshikawa, Hideki, Shinotsuka, Hiroshi, and Ueda, Ryuichi

Journal:

Journal of Electron Spectroscopy and Related Phenomena

Date Uploaded:

26/06/2020

Date Modified:

02/07/2021