Index Catalog // MDR

Description/Abstract:: Siウェハーおよび測定条件の違いによるXPSスペクトルの変化を測定したXPSスペクトルデータセット。SPring-8 BL15で測定。「試料名、抵抗率、X線アナライザー角度、ID」の構造でフォルダ分けされている（ただしAuでは「試料名、X線アナライザー角度、ID」）。本デー...
Keyword:: SPring-8 BL15, Si, and XPS
Resource Type:: Dataset
Data origin:: experiments
Author:: SUMIYA, Masatomo
Date Uploaded:: 23/05/2024

Description/Abstract:: The surface oxidation behavior of different GaN surfaces (the polar Ga-face (+c) and the nonpolar m-plane) under H<sub>2</sub>O vapor amb...
Keyword:: GaN, Gallium nitride, MOS structure, Oxidation, SPring-8, Surface oxidation, and XPS
Resource Type:: Dataset
Data origin:: other
Author:: SUMIYA, Masatomo
Date Uploaded:: 14/02/2023
Date Modified:: 28/02/2023

Description/Abstract:: The initial adsorption behavior of different GaN surfaces (the polar Ga-face (+c) and N-face (−c) and the nonpolar (101̅0) (m)-plane) und...
Keyword:: Adsorption, GaN, Gallium nitride, Oxidation, SPring-8, and XPS
Resource Type:: Dataset
Data origin:: other
Author:: SUMIYA, Masatomo
Date Uploaded:: 31/01/2023
Date Modified:: 28/02/2023

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