Skip to Content
Toggle navigation
Home
About
Help
Contact
Login
Search MDR
Go
Search Constraints
Start Over
Filtering by:
Author
OGIWARA, Toshiya
Remove constraint Author: OGIWARA, Toshiya
Material/Specimen
GaAs/AlAs multilayer
Remove constraint Material/Specimen: GaAs/AlAs multilayer
1
entry found
Sort by relevance
relevance
date uploaded ▼
date uploaded ▲
date modified ▼
date modified ▲
Number of results to display per page
10 per page
10
per page
20
per page
50
per page
100
per page
View results as:
List
Gallery
Masonry
Slideshow
Search Results
Auger Depth Profile Analysis of GaAs/AIAs Thin Film by Synthesized Spectrum Method Using Non-Negative Least Square Curve Fitting
Description/Abstract:
We have carried out the Auger depth profiling analysis of GaAs/AIAs multilayer structure using the peaks of GaMVV and A1LVV. Since the tw...
Keyword:
Auger depth profiling analysis
,
GaAs/AlAs multilayer
,
non-negative least-square curve fit
, and
peak separation
Material/Specimen:
GaAs/AlAs multilayer
Resource Type:
Article
Author:
OGIWARA, Toshiya
and
TANUMA, Shigeo
Journal:
Journal of The Surface Science Society of Japan
Date Uploaded:
01/10/2021
Date Modified:
01/10/2021
Toggle facets
Limit your search
Type of work
Publication
1
Keyword
Auger depth profiling analysis
1
GaAs/AlAs multilayer
1
non-negative least-square curve fit
1
peak separation
1
Language
Japanese
1
Publisher
Surface Science Society of Japan
1
Resource type
Article
1
Visibility
open
1
Rights Statement Sim
In Copyright
1
Material/Specimen
GaAs/AlAs multilayer
[remove]
1
Author
OGIWARA, Toshiya
[remove]
1
TANUMA, Shigeo
1
Journal
Journal of The Surface Science Society of Japan
1