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Measurement of the Low-Energy Electron Inelastic Mean Free Path in Monolayer Graphene

Description/Abstract:

Measuring the electron-transport properties of substrate-supported nanomaterials with the traditional two-point comparison method is diff...

Keyword:

four-point probe technique, inelastic mean free path, and monolayer graphene

Resource Type:

Article

Author:

Bo Da, Yang Sun, Zhufeng Hou, Jiangwei Liu, Nguyen Thanh Cuong, Kazuhito Tsukagoshi, Hideki Yoshikawa, Shigeo Tanuma, Jin Hu, Zhaoshun Gao, and Zejun Ding

Date Uploaded:

04/04/2023

Date Modified:

05/04/2023
Virtual substrate method for nanomaterials characterization

Description/Abstract:

Characterization techniques available for bulk or thin-film solid-state materials have been extended to substrate-supported nanomaterials...

Keyword:

Virtual substrate method

Resource Type:

Article

Author:

Bo Da, Jiangwei Liu, Mahito Yamamoto, Yoshihiro Ueda, Kazuyuki Watanabe, Nguyen Thanh Cuong, Songlin Li, Kazuhito Tsukagoshi, Hideki Yoshikawa, Hideo Iwai, Shigeo Tanuma, Hongxuan Guo, Zhaoshun Gao, Xia Sun, and Zejun Ding

Date Uploaded:

28/02/2023