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Filtering by: Characterization methods microscopy -- scanning transmission electron microscopy Author Nakazawa Katsuaki Keyword aberration correction

Ptychographical reconstruction code by Wigner Distribution Deconvolution （WDD）

Description/Abstract:

Codes for Ptychographical reconstruction by WDD method and aberration measuremnt. The codes were originally developed by Katsuaki Naka...

Keyword:

ptychography, 4DSTEM, electron microscopy, Wigner distribution deconvolution, and aberration correction

Resource Type:

Software or Program Code

Data origin:

other

Author:

Nakazawa Katsuaki and Mitsuishi Kazutaka

Date Uploaded:

01/12/2022

Date Modified:

07/02/2023