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Keyword
- Ultra Low Angle Incidence Ion Beam3
- Auger Depth Profiling Analysis2
- HfO2/Si2
- Active Shirley method1
- Akaike information criterion (AIC)1
- Auger Depth Profiling analysis1
- Automatic spectrum analysis1
- Bayesian information criterion1
- Bayesian information criterion (BIC)1
- EAL1
- Electron Inelastic Mean Free Path1
- FeNi/CoFeB/FeNi Thin Film 1
- IMFP1
- MED1
- Multiple core level spectra1
- X-ray photoelectron spectroscopy1
- X-ray photoelectron spectroscopy (XPS)1
- asymmetry parameter1
- effective attenuation length1
- high-energy photoelectron spectroscopy1